Features

• Electrically screened to DLA SMD# 5962-99560

• QML qualified per MIL-PRF-38535 requirements

• Latch-up immune

• Radiation acceptance testing - HS-4424DRH

- High dose rate (50-300rad(Si)/s). . . . . . . . . . . 300krad(Si)

• Radiation acceptance testing - HS-4424DEH

- High dose rate (50-300rad(Si)/s). . . . . . . . . . . 300krad(Si)

- Low dose rate (0.01rad(Si)/s) . . . . . . . . . . . . . 50krad(Si)*

*Limit established by characterization

• IPEAK. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >2A (minimum)

• Matched rise and fall times (CL = 4300pF). . 75ns (maximum)

• Low voltage lockout feature . . . . . . . . . . . . . . . . . . . . . . . . <8V

• Wide supply voltage range . . . . . . . . . . . . . . . . . . . . 8V to 18V

• Propagation delay . . . . . . . . . . . . . . . . . . . .250ns (maximum)

• Consistent delay times with VCC changes

• Low power consumption

- 40mW with inputs high

- 20mW with inputs low

• Low equivalent input capacitance . . . . . . . . . . 3.2pF (typical)

• ESD protected. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >4kV